DocumentCode :
1184370
Title :
Yield maximization and worst-case design with arbitrary statistical distributions
Author :
Brayton, Robert K. ; Director, Stephen W. ; Hachtel, Gary D.
Volume :
27
Issue :
9
fYear :
1980
fDate :
9/1/1980 12:00:00 AM
Firstpage :
756
Lastpage :
764
Abstract :
We describe a method by which a variety of statistical design problems can be solved by a linear program. We describe three key aspects of this approach. 1) The correspondence between the level contours of a given probability density function and a particular norm, which we shall call a pdf-norm. 2) The expression of distance in this norm from a given set of hyperplanes in terms of the dual of the pdf-norm. 3) The use of a linear program to inscribe a maximal pdf-norm-body into a simplicial approximation to the feasible region of a given statistical design problem. This work thus extends the applicability of a previously published algorithm, to the case of arbitrary pdf-norms and consequently to a wide variety of statistical design problems including the common mixed worstcase-yield maximization problem.
Keywords :
Computer-aided circuit analysis and design; Network synthesis; Network tolerance assignment; Electronic circuits; Fluctuations; Gaussian distribution; Integrated circuit yield; Linear programming; Manufacturing processes; Power supplies; Probability density function; Statistical distributions; Voltage;
fLanguage :
English
Journal_Title :
Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-4094
Type :
jour
DOI :
10.1109/TCS.1980.1084889
Filename :
1084889
Link To Document :
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