• DocumentCode
    1184699
  • Title

    Introduction to special issue

  • Author

    Goldstein, L. ; Williams, Tyson

  • Volume
    28
  • Issue
    11
  • fYear
    1981
  • fDate
    11/1/1981 12:00:00 AM
  • Firstpage
    1025
  • Lastpage
    1026
  • Keywords
    Computer testing; Special issues; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Design for testability; Logic design; Logic testing; Programmable logic arrays; Special issues and sections; System testing;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-4094
  • Type

    jour

  • DOI
    10.1109/TCS.1981.1084925
  • Filename
    1084925
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1184699