Title :
Introduction to special issue
Author :
Goldstein, L. ; Williams, Tyson
fDate :
11/1/1981 12:00:00 AM
Keywords :
Computer testing; Special issues; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Design for testability; Logic design; Logic testing; Programmable logic arrays; Special issues and sections; System testing;
Journal_Title :
Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCS.1981.1084925
