• DocumentCode
    1184919
  • Title

    Absolute Spectral Radiation Measurements From 200-ns 200-kA X -Pinch in 10-eV–10-keV Range With 1-ns Resolution

  • Author

    Aranchuk, Leonid E. ; Larour, Jean

  • Author_Institution
    Lab. de Phys. et Technol. des Plasmas, Ecole Polytech., Palaiseau
  • Volume
    37
  • Issue
    4
  • fYear
    2009
  • fDate
    4/1/2009 12:00:00 AM
  • Firstpage
    575
  • Lastpage
    579
  • Abstract
    A series of seven X-ray diodes and four Si p-i-n detectors with K- and L-filters was employed to measure the absolute time-resolved spectra of 200-ns 200-kA molybdenum and copper X-pinch plasmas. We observe a 10-mum-size 0.4-0.7-ns X-ray source at a total power yield level of 1.5 GW with about 35% in the range above 1 keV. The extreme ultraviolet part of the spectrum can be fitted by a Planckian function with a temperature of 65-75 eV. In the region above 800 eV, the spectrum can be fitted by an exponential distribution with an effective temperature of ~1 keV for Mo X-pinch and ~500 eV for Cu plasma. The X-ray source yields 200-550 mJ in this spectral range. The total XUV and X-ray yield varies in the range 10-30 J.
  • Keywords
    Z pinch; copper; molybdenum; plasma X-ray sources; plasma diagnostics; plasma temperature; Cu; K-filter; L-filter; Mo; Planckian function; Si p-i-n detectors; X-ray diodes; X-ray source; X-ray yield; XUV yield; absolute spectral radiation measurements; absolute time-resolved spectra; copper X-pinch plasma; current 200 kA; electron volt energy 10 eV to 10 keV; energy 10 J to 30 J; energy 200 mJ to 550 mJ; molybdenum X-pinch plasma; plasma temperature; power 1.5 GW; size 10 mum; time 0.4 ns to 0.7 ns; time 200 ns; ultraviolet spectrum; A plasma pinch; X-ray imaging; X-ray spectroscopy;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2009.2013229
  • Filename
    4797891