DocumentCode
118492
Title
Vacancy induced phonon properties of hydrogen passivated graphene
Author
Islam, Md Shariful ; Rahman, M.T. ; Bhuiyan, A.G. ; Hashimoto, Aiko
Author_Institution
Univ. of Fukui, Fukui, Japan
fYear
2014
fDate
13-15 Feb. 2014
Firstpage
1
Lastpage
5
Abstract
The phonon properties of hydrogen passivated graphene with vacancy defects are studied using the forced vibrational method. The phonon density of states (PDOS) and typical mode patterns are calculated over a broad range of vacancies. We find that phonon properties of graphene strongly depend on the system size. We observe a broadening and softening of the PDOS peaks with the increase of vacancy concentrations. We find an increasing C-H stretching mode with the increase of defect density. Our numerical experiments reveal that the typical mode pattern for K point in-plane TO modes phonon show the spatial localized vibrations persuaded by vacancy defects, which are in conceptually good agreement with the experimental results of the large D band peak of the Raman spectra comes from the imperfections of crystal. The typical displacement pattern for C-H stretching mode shows a random displacement of H atoms in contrast to C atoms. Our simulation results show the significant impact of vacancy defects on the vibrational properties of graphene.
Keywords
graphene; hydrogen; phonon-defect interactions; soft modes; vacancies (crystal); C-H; C-H stretching mode; K point in-plane TO modes; defect density; forced vibrational method; hydrogen passivated graphene; mode patterns; phonon density of states; spatial localized vibrations; vacancy concentrations; vacancy defects; vacancy induced phonon properties; Atomic clocks; Atomic measurements; Force; Graphene; Lattices; Phonons; Vibrations; Lattice vibration; graphene; hydrogen passivation; phonon density of states; vacancy defects;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Information and Communication Technology (EICT), 2013 International Conference on
Conference_Location
Khulna
Print_ISBN
978-1-4799-2297-0
Type
conf
DOI
10.1109/EICT.2014.6777848
Filename
6777848
Link To Document