Title :
Fault-tolerant round-robin A/D converter system
Author :
Beckmann, Paul E. ; Musicus, Bruce R.
Author_Institution :
Res. Lab. of Electron., MIT, Cambridge, MA, USA
fDate :
12/1/1991 12:00:00 AM
Abstract :
A robust A/D converter system that requires much less hardware overhead than traditional modular redundancy approaches is described. A modest amount of oversampling generates information that is exploited to achieve fault tolerance. A generalized likelihood ratio test is used to detect the most likely failure and also to estimate the optimum signal reconstruction. The error detection and correction algorithm reduces to a simple form and requires only a slight amount of hardware overhead. A derivation of the algorithm is presented, and modifications that lead to a realizable system are discussed. The authors then evaluate overall performance through software simulations
Keywords :
analogue-digital conversion; error correction; error detection; failure analysis; error correction; error detection; fault tolerance; hardware overhead; likelihood ratio test; optimum signal reconstruction; oversampling; realizable system; round-robin A/D converter system; software simulations; Computer errors; Error correction; Fault tolerance; Fault tolerant systems; Hardware; Redundancy; Robustness; Signal reconstruction; Software performance; Testing;
Journal_Title :
Circuits and Systems, IEEE Transactions on