Title :
Measurement of phase error distributions in silica-based arrayed-waveguide grating multiplexers by using Fourier transform spectroscopy
Author :
Takada, Kazumasa ; Inoue, Yasuyuki ; Yamada, Hiroyoshi ; Horiguchi, M.
Author_Institution :
NTT Opto-Electron. Labs., Ibaraki
fDate :
9/29/1994 12:00:00 AM
Abstract :
The phase errors caused by deviations in the designed lengths of the optical paths in silica-based arrayed-waveguide grating (AWG) multiplexers were measured using Fourier transform spectroscopy. The measurement accuracy was ±1°. The phase errors in an AWG multiplexer with a channel spacing of 10 GHz and a channel crosstalk of -15 dB were randomly distributed between -122 and 90°
Keywords :
Fourier transform spectra; diffraction gratings; errors; integrated optics; multiplexing equipment; optical waveguides; Fourier transform spectroscopy; SiO2; channel crosstalk; channel spacing; optical path lengths; phase error distributions; silica-based arrayed-waveguide grating multiplexers;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19941113
