Title :
Built-in dynamic current sensor circuit for digital VLSI CMOS testing
Author :
Segura, Jaume ; Roca, M. ; Mateo, D. ; Rubio, Albert
Author_Institution :
Dept. of Phys., Balearic Islands Univ., Palma de Mallorca
fDate :
9/29/1994 12:00:00 AM
Abstract :
IDDQ testing is a powerful strategy for detecting defects that do not alter the logic behaviour of CMOS ICs. Such a technique is very effective especially in the detection of bridging defects although some open defects can be also detected. However, an important set of open defects escapes quiescent power supply current testing because they prevent any current elevation. As a solution, dynamic current testing is investigated. A built-in dynamic current sensor is proposed
Keywords :
CMOS integrated circuits; VLSI; built-in self test; electric sensing devices; integrated circuit testing; integrated logic circuits; logic testing; bridging defects; built-in dynamic current sensor circuit; defect detection; digital VLSI CMOS testing; logic behaviour; open defects;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19941168
