DocumentCode :
1186082
Title :
Some Dynamic Measurements of Electronic Motion in Multigrid Valves
Author :
Strutt, M.J.O. ; Van Der Ziel, A.
Author_Institution :
Natuurkundig Laboratorium der N. V. Philips´´ Gloeilampenfabrieken, Eindhoven, Holland
Volume :
27
Issue :
3
fYear :
1939
fDate :
3/1/1939 12:00:00 AM
Firstpage :
218
Lastpage :
225
Abstract :
Recently developed means for measuring tube admittances on short waves are described in a general way in the introduction. Admittances, which are chiefly dealt with, are the input admittance between the input grid and the cathode and the complex transconductance between the input grid and the anode. In section II a pentode, consisting of a cathode, grid 1, grid 2, grid 3, and an anode is considered. Grid 1 is negative, grid 2 positive, grid 3 either negative or positive, and the anode positive. The probability of an electron, arriving before grid 3, to pass through grid 3 is called α and the probability that an electron, which is returned before grid 3, arrives a second time before grid 3 is called β. Input grid admittance is calculated in terms of α and β, two expressions being obtained, one being the additional input damping due to electrons returning before grid 3 and the other being the additional input capacitance due to the same cause. Measurements of these quantities for pentodes, hexodes, heptodes, and octodes are described in section III, whereas α and β are calculated from these measurements in section IV, several checks being obtained. In section V formulas for the influence of returning electrons on complex transconductance are derived and applied to measurements in section VI.
Keywords :
Admittance measurement; Anodes; Cathodes; Circuit optimization; Electron tubes; Frequency; Motion measurement; RLC circuits; Transconductance; Valves;
fLanguage :
English
Journal_Title :
Proceedings of the IRE
Publisher :
ieee
ISSN :
0096-8390
Type :
jour
DOI :
10.1109/JRPROC.1939.228141
Filename :
1686869
Link To Document :
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