DocumentCode :
1186168
Title :
High power 980 nm nonabsorbing facet lasers
Author :
Ungar, J.E. ; Oh, Ser Wah ; Chen, Jim S.
Author_Institution :
Ortel Corp., Alhambra, CA
Volume :
30
Issue :
21
fYear :
1994
fDate :
10/13/1994 12:00:00 AM
Firstpage :
1766
Lastpage :
1767
Abstract :
Laser diodes emitting at 0.98 μm with epitaxially grown nonabsorbing facets have been fabricated. Catastrophic facet damage is not observed at thermally limited powers as high as 500 mW. Accelerated lifetesting at 100 mW and 50°C shows the devices to have good reliability characteristics
Keywords :
reliability; semiconductor epitaxial layers; semiconductor lasers; 100 mW; 50 C; 500 mW; 980 nm; accelerated lifetesting; catastrophic facet damage; epitaxially grown nonabsorbing facets; high power lasers; laser diodes; reliability; thermally limited powers;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19941177
Filename :
328559
Link To Document :
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