Calibration and compensation of near-field scan measurements

Author

Shi, Jin ; Cracraft, Michael A. ; Slattery, Kevin P. ; Yamaguchi, Masahiro ; Dubroff, Richard E.

Author_Institution

Intel Corp., Santa Clara, CA, USA

Volume

47

Issue

3

fYear

2005

Firstpage

642

Lastpage

650

Abstract

A procedure for the calibration and compensation of near-field scanning is described and demonstrated. Ultimately, the objective is to quantify the individual field components associated with electromagnetic interference (EMI) from high speed circuitry and devices. Specific examples of these methods are shown. The effects of compensation are small but noticeable when the uncompensated output signal from near field scanning is already a very good representation of the field being measured. In other cases, the improvement provided by compensation can be significant when the uncompensated output signal bears little resemblance to the underlying field.

Keywords

calibration; electric field measurement; electromagnetic interference; EMI; electromagnetic interference; field components; near-field scan measurements; Calibration; Current measurement; Electric variables measurement; Electromagnetic interference; Electromagnetic measurements; Integrated circuit measurements; Magnetic field measurement; Printed circuits; Probes; Semiconductor device measurement; Calibration; compensation; near-field probes; near-field scanning;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/TEMC.2005.853165

Filename

1516236