DocumentCode
1186324
Title
Correlation between light and current induced degradation in a-Si solar cells
Author
Yanagisawa, Takufumi
Author_Institution
Electrotech. Lab., Tsukuba
Volume
30
Issue
21
fYear
1994
fDate
10/13/1994 12:00:00 AM
Firstpage
1802
Lastpage
1803
Abstract
Long-term degradation tests were carried out on amorphous silicon solar cells by light irradiation and current injection. The correlation of the degradation patterns and the lifetime estimation data in these two methods have confirmed the mutual stress conversion of light and current intensity. It is possible to estimate the lifetime of solar cells
Keywords
amorphous semiconductors; elemental semiconductors; life testing; reliability; semiconductor device testing; silicon; solar cells; Si; amorphous Si; current induced degradation; current injection; degradation patterns; lifetime estimation data; light induced degradation; light irradiation; long-term degradation tests; mutual stress conversion; solar cells;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19941176
Filename
328575
Link To Document