Title :
Correlation between light and current induced degradation in a-Si solar cells
Author :
Yanagisawa, Takufumi
Author_Institution :
Electrotech. Lab., Tsukuba
fDate :
10/13/1994 12:00:00 AM
Abstract :
Long-term degradation tests were carried out on amorphous silicon solar cells by light irradiation and current injection. The correlation of the degradation patterns and the lifetime estimation data in these two methods have confirmed the mutual stress conversion of light and current intensity. It is possible to estimate the lifetime of solar cells
Keywords :
amorphous semiconductors; elemental semiconductors; life testing; reliability; semiconductor device testing; silicon; solar cells; Si; amorphous Si; current induced degradation; current injection; degradation patterns; lifetime estimation data; light induced degradation; light irradiation; long-term degradation tests; mutual stress conversion; solar cells;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19941176
