DocumentCode
1186481
Title
Performance-Aware Corner Model for Design for Manufacturing
Author
Lin, Chung-Hsun ; Dunga, Mohan V. ; Lu, Darsen D. ; Niknejad, Ali M. ; Hu, Chenming
Author_Institution
T.J. Watson Res. Center, IBM, Yorktown Heights, NY
Volume
56
Issue
4
fYear
2009
fDate
4/1/2009 12:00:00 AM
Firstpage
595
Lastpage
600
Abstract
We present a methodology to generate performance-aware corner models (PAMs). Accuracy is improved by emphasizing electrical variation data and reconciling the process and electrical variation data. PAM supports corner (plusmnsigma and plusmn 2sigma) simulation and Monte Carlo simulation. Furthermore, PAM supports the practice of application-specific corner cards, for example, for gain-sensitive applications.
Keywords
Monte Carlo methods; design for manufacture; integrated circuit design; integrated circuit manufacture; Monte Carlo simulation; application-specific corner card; design for manufacturing; electrical variation data; performance-aware corner model; CMOS technology; Circuit optimization; Circuit simulation; Monte Carlo methods; Predictive models; Principal component analysis; SPICE; Semiconductor device modeling; Very large scale integration; Virtual manufacturing; Compact model; Monte Carlo (MC); corner model; variations;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2008.2011845
Filename
4798195
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