• DocumentCode
    1186679
  • Title

    Band faults: Efficient approximations to fault bands for the simulation before fault diagnosis of linear circuits

  • Author

    Pahwa, Anil ; Rohrer, Ronald A.

  • Volume
    29
  • Issue
    2
  • fYear
    1982
  • fDate
    2/1/1982 12:00:00 AM
  • Firstpage
    81
  • Lastpage
    88
  • Abstract
    "Band faults," the approximate movements of nominal worstcase boundaries with catastropic faults, are much more efficiently computed than the "fault bands" that they approximate. Derived from a simulation before test, band faults can be used to create a fault dictionary that is supposed to isolate single element catastrophic faults. By no means general, the approach when applied to several example linear circuits nonetheless has yielded promising results.
  • Keywords
    Analog system testing; Computer-aided circuit analysis and design; Linear circuits, time-invariant; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer aided software engineering; Dictionaries; Fault diagnosis; Laboratories; Linear circuits; Physics;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-4094
  • Type

    jour

  • DOI
    10.1109/TCS.1982.1085114
  • Filename
    1085114