DocumentCode
1186679
Title
Band faults: Efficient approximations to fault bands for the simulation before fault diagnosis of linear circuits
Author
Pahwa, Anil ; Rohrer, Ronald A.
Volume
29
Issue
2
fYear
1982
fDate
2/1/1982 12:00:00 AM
Firstpage
81
Lastpage
88
Abstract
"Band faults," the approximate movements of nominal worstcase boundaries with catastropic faults, are much more efficiently computed than the "fault bands" that they approximate. Derived from a simulation before test, band faults can be used to create a fault dictionary that is supposed to isolate single element catastrophic faults. By no means general, the approach when applied to several example linear circuits nonetheless has yielded promising results.
Keywords
Analog system testing; Computer-aided circuit analysis and design; Linear circuits, time-invariant; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer aided software engineering; Dictionaries; Fault diagnosis; Laboratories; Linear circuits; Physics;
fLanguage
English
Journal_Title
Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0098-4094
Type
jour
DOI
10.1109/TCS.1982.1085114
Filename
1085114
Link To Document