• DocumentCode
    1187073
  • Title

    Analog Fault Diagnosis with Failure Bounds

  • Author

    Wu, Chwan-chia ; Nakajima, Kazug ; Wey, Chin-Long ; Saeks, Richard

  • Volume
    29
  • Issue
    5
  • fYear
    1982
  • fDate
    5/1/1982 12:00:00 AM
  • Firstpage
    277
  • Lastpage
    284
  • Abstract
    A simulation-after-test algorithm for the analog fault diagnosis problem is proposed in which a bound on the maximum number of simultaneous failures is used to minimize the number of test points required. The resultant algorithm is applicable to both linear and nonlinear systems with multiple hard or soft faults and can be used to isolate failures up to an arbitrarily specified "replaceable chip or subsystem."
  • Keywords
    Analog system testing; Nonlinear networks and systems; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Costs; Equations; Fault diagnosis; Nonlinear systems; System testing; Vectors;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-4094
  • Type

    jour

  • DOI
    10.1109/TCS.1982.1085154
  • Filename
    1085154
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1187073