Title :
Measured and modeled conducted susceptibility characteristics of a lithium niobate electrooptic modulator
Author_Institution :
Georgia Tech. Res. Inst., Atlanta, GA, USA
fDate :
11/1/1994 12:00:00 AM
Abstract :
The electromagnetic (EM) susceptibility of an electrooptic (E-O) modulator is characterized. A nonlinear susceptibility model and measured results are presented for a Crystal Technology MZ385P optical guided-wave intensity modulator. The transfer function for the E-O modulator is expressed in closed form and a Bessel function expansion of this transfer function is used to predict nonlinear effects. The nonlinear effects which are modeled include gain compression, radiant power offset, harmonic generation, and intermodulation generation. The model predictions are compared to measured data at in-band and out-of-band frequencies. At in-band frequencies, excellent agreement is obtained between measured and modeled nonlinear product levels. At out-of-band frequencies, variations in the nonlinear output product levels are explained by the frequency-dependent gain characteristics of the modulator
Keywords :
Bessel functions; Mach-Zehnder interferometers; electro-optical effects; electro-optical modulation; electromagnetic interference; lithium compounds; nonlinear optics; Bessel function expansion; LiNbO3; Mach-Zehnder interferometer; closed form; conducted susceptibility characteristics; electromagnetic susceptibility; frequency-dependent gain characteristics; gain compression; harmonic generation; in-band frequencies; intermodulation generation; lithium niobate electrooptic modulator; measured data; model predictions; nonlinear effects; nonlinear output product levels; nonlinear susceptibility model; optical guided-wave intensity modulator; out-of-band frequencies; radiant power offset; transfer function; Electromagnetic measurements; Electrooptic modulators; Frequency measurement; Intensity modulation; Nonlinear optics; Optical harmonic generation; Optical modulation; Power generation; Predictive models; Transfer functions;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on