An absorber tip diffraction coefficient

Author

Joseph, Philip J. ; Tyson, Albert D. ; Burnside, Walter D.

Author_Institution

Dedicated Electronics Inc., Chester, NH, USA

Volume

36

Issue

4

fYear

1994

fDate

11/1/1994 12:00:00 AM

Firstpage

372

Lastpage

379

Abstract

The UTD corner diffraction solution for a perfectly conducting corner is empirically modified for the case of a dielectric corner. The dielectric may be lossless or lossy, but is assumed to be homogeneous. This modified solution is used to calculate the bistatic scattering from the tip of a dielectric pyramid. Sample calculations display some features of the scattering from a single lossy dielectric pyramid. To verify the solution, calculations are compared with backscatter measurements of a single pyramid that is cut from a homogeneous lossless dielectric (polyethylene). Calculations are then compared with measurements for the more pertinent case of bistatic scattering from a wall of pyramidal radar absorbing material

Keywords

backscatter; dielectric properties; electromagnetic wave diffraction; electromagnetic wave scattering; geometrical theory of diffraction; UTD corner diffraction solution; absorber tip diffraction coefficient; backscatter measurements; bistatic scattering; dielectric corner; homogeneous dielectric; lossless dielectric; lossy dielectric pyramid; perfectly conducting corner; polyethylene; pyramidal radar absorbing material; Backscatter; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Diffraction; Displays; Loss measurement; Polyethylene; Radar measurements; Radar scattering;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/15.328869

Filename

328869