DocumentCode :
118776
Title :
The influence of imposed electric current on the tensile fracture behavior of micro-scale Cu/Sn-3.0Ag-0.5Cu/Cu solder joints
Author :
Wang-Yun Li ; Hong-Bo Qin ; Min-Bo Zhou ; Xin-Ping Zhang
Author_Institution :
Sch. of Mater. Sci. & Eng., South China Univ. of Technol., Guangzhou, China
fYear :
2014
fDate :
12-15 Aug. 2014
Firstpage :
1030
Lastpage :
1034
Abstract :
The fracture behavior of microscale lead-free Sn-3.0Ag-0.5Cu solder joints under electrotensile load was characterized, in comparison with those under pure tensile load. Experimental results show that under electrotensile load the stress-strain and strain-time curves of joints exhibit three distinct stages, i.e., the fast deformation stage at the beginning of loading, linear deformation stage and the accelerating fracture stage. No significant difference in strain feature between the electrotensile loaded joint and pure tensile loaded joint was observed. The solder joints under electrotensile loading and tensile loading exhibit the same fracture mechanism at the same thickness-to-diameter ratio of joints, while the fracture strength of solder joints under electrotensile load is decreased greatly compared with that under pure tensile load, even lower than that of the bulk solder. Moreover, the orientation of β-Sn grains may tend to rearrange along the direction of current stressing under electrotensile loading.
Keywords :
copper alloys; electric current; fracture toughness; silver alloys; solders; stress-strain relations; tensile strength; tin alloys; Sn-3.0Ag-0.5Cu; accelerating fracture stage; bulk solder; electrotensile loaded joint; fracture strength; imposed electric current; linear deformation stage; microscale lead-free solder joint; pure tensile loaded joint; strain-time curve; stress-strain curve; tensile fracture behavior; Copper; Current; Joints; Loading; Soldering; Strain; Stress; Electrotensile; Sn-3.0Ag-0.5Cu solder; fracture behavior; microscale solder joint;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
Conference_Location :
Chengdu
Type :
conf
DOI :
10.1109/ICEPT.2014.6922822
Filename :
6922822
Link To Document :
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