DocumentCode :
1187902
Title :
Measurements of real ESD threats have been ignored too long
Author :
Barth, Jon
Volume :
8
Issue :
4
fYear :
2005
Firstpage :
61
Lastpage :
63
Abstract :
Electrostatic discharge (ESD) protection circuits are built into every pin of an integrated circuit (IC) to protect the core operating circuits. Many different standards groups have assumed the responsibility of producing ESD testing standards for the IC industry. The quality of ESD testing and their standards have suffered from a lack of measurement updates without an effort for periodic investigations of the real threat from ESD. Measurements to determine the real parameters of ESD threat have been ignored for too long. The present tests and standards will continue because organized ESD experts in standards groups are unconcerned with the real threat and can ignore the new data we have measured.
Keywords :
electrostatic discharge; integrated circuit measurement; integrated circuit reliability; integrated circuit testing; ESD testing standards; ESD threat; electrostatic discharge protection circuits; integrated circuit measurement; integrated circuit reliability; integrated circuit testing; measurement updates; Circuit testing; Dielectrics; Electrostatic discharge; Fault location; Protection; Pulse circuits; Pulse measurements; Sparks; Time measurement; Voltage;
fLanguage :
English
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
Publisher :
ieee
ISSN :
1094-6969
Type :
jour
DOI :
10.1109/MIM.2005.1518625
Filename :
1518625
Link To Document :
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