Title :
Cross calibration of the Landsat-7 ETM+ and EO-1 ALI sensor
Author :
Chander, Gyanesh ; Meyer, David J. ; Helder, Dennis L.
Author_Institution :
Earth Resources Obs. Syst. Data Center, Sci. Applic. Int. Corp., Sioux Falls, SD, USA
Abstract :
As part of the Earth Observer 1 (EO-1) Mission, the Advanced Land Imager (ALI) demonstrates a potential technological direction for Landsat Data Continuity Missions. To evaluate ALI´s capabilities in this role, a cross-calibration methodology has been developed using image pairs from the Landsat-7 (L7) Enhanced Thematic Mapper Plus (ETM+) and EO-1 (ALI) to verify the radiometric calibration of ALI with respect to the well-calibrated L7 ETM+ sensor. Results have been obtained using two different approaches. The first approach involves calibration of nearly simultaneous surface observations based on image statistics from areas observed simultaneously by the two sensors. The second approach uses vicarious calibration techniques to compare the predicted top-of-atmosphere radiance derived from ground reference data collected during the overpass to the measured radiance obtained from the sensor. The results indicate that the relative sensor chip assemblies gains agree with the ETM+ visible and near-infrared bands to within 2% and the shortwave infrared bands to within 4%.
Keywords :
calibration; geophysical equipment; radiometry; remote sensing by radar; vegetation mapping; Advanced Land Imager; EO-1 ALI sensor; Earth Observer 1 mission; Enhanced Thematic Mapper Plus; Landsat data continuity missions; Landsat radiance; Landsat-7 ETM+; Railroad Valley Playa; White Sands; cross calibration methodology; ground reference data; image statistics; radiometric calibration; radiometry; relative sensor chip assembly; relative spectral response; shortwave infrared bands; surface observations; top-of-atmosphere radiance; vicarious calibration techniques; visible band; visible near-infrared band; Assembly; Calibration; Earth; Image sensors; Infrared sensors; Radiometry; Remote sensing; Satellites; Semiconductor device measurement; Statistics;
Journal_Title :
Geoscience and Remote Sensing, IEEE Transactions on
DOI :
10.1109/TGRS.2004.836387