• DocumentCode
    1187976
  • Title

    Flash memories: the best of two worlds

  • Author

    Pashley, Richard D. ; Lai, Stefan K.

  • Author_Institution
    Intel Corp., Folsom, CA, USA
  • Volume
    26
  • Issue
    12
  • fYear
    1989
  • Firstpage
    30
  • Lastpage
    33
  • Abstract
    The use of flash memories, which are based on the technology of either erasable programmable ROMs (EPROMs) or electrically erasable programmable ROMs (EEPROMs), as an alternative to both of the latter is discussed. Their properties are compared to those of EPROMs and EEPROMs. Quality and reliability issues are considered. The future of all three memory types is discussed.<>
  • Keywords
    EPROM; circuit reliability; integrated memory circuits; EEPROMs; EPROMs; electrically erasable programmable ROMs; erasable programmable ROMs; flash memories; quality; reliability; Application software; Application specific integrated circuits; Costs; EPROM; Filling; Flash memory; Paper technology; Random access memory; Read only memory; Semiconductor memory;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/6.45032
  • Filename
    45032