Title :
Transistor Failure Modes in High Power Switching Operation
Author :
Mathews, Joseph W.
Author_Institution :
Advanced Development Laboratory, Consumer Products Division, Philco Corporation, Philadelphia, Pennsylvania.
fDate :
7/1/1962 12:00:00 AM
Abstract :
It is desirable to use power transistors as switches up to their maximum collector-emitter voltage capability (BVcex). In this type operation, failure phenomena during switch-off have been observed and attributed in the literature to second breakdown, punch through, reach through, pinch off, and various types of energy level effects.
Keywords :
Breakdown voltage; Circuits; Consumer products; Energy states; Laboratories; Power engineering and energy; Power transistors; Switches; Switching loss; TV;
Journal_Title :
Broadcast and Television Receivers, IRE Transactions on
DOI :
10.1109/TBTR2.1962.4503215
