Title :
Reliability Considerations in the Application of Power Transistors to Consumer Products
Author :
Wheatley, C.F. ; Englund, J.W.
Author_Institution :
Radio Corporation of America, Semiconductor and Materials Division, Somerville, N.J.
fDate :
7/1/1962 12:00:00 AM
Keywords :
Circuits; Consumer products; Frequency response; Impedance; Power transistors; Safety; Semiconductor materials; Temperature; Thermal resistance; Voltage;
Journal_Title :
Broadcast and Television Receivers, IRE Transactions on
DOI :
10.1109/TBTR2.1962.4503220
