DocumentCode
118820
Title
The effect of coating thickness and external force on the growth of tin whisker
Author
Yao, Z.X. ; Yin, L.M. ; Zhang, L.P. ; Zhou, J.
Author_Institution
Sch. of Metall. & Mater. Eng., Chongqing Univ. of Sci. & Technol., Chongqing, China
fYear
2014
fDate
12-15 Aug. 2014
Firstpage
100
Lastpage
1103
Abstract
In this paper, tin whisker behaviour of electroplating tin coating was studied in different environments. Different thickness of electroplating tin coating on copper substrate had been tested. Two different environmental conditions had been applied :one temperature tests (70 °C)and one external force tests(70 °C /17.5N). The growth of tin whisker was studied by using scanning electron microscopy (SEM). It is observed that the electroplating tin coating was capable of growing tin whiskers. Most of the detected whiskers are so called “nodule” type whiskers, approximately 10-15μm length with 3.28μm thickness. It was found that the thickness of coating has a major effect on causing tin whiskers of the electroplating tin coating. Another reason is large residual stress in the thin coating. In addition, it is found that pressure can induce the growth of tin whisker more easily than tension.
Keywords
copper; electroplating; internal stresses; materials testing; scanning electron microscopy; substrates; tin; whiskers (crystal); SEM; Sn; coating thickness; copper substrate; electroplating tin coating; external force; external force test; nodule type whisker; residual stress; scanning electron microscopy; temperature 70 C; temperature test; tin coating; tin whisker growth; Aging; Coatings; Copper; Force; Materials; Stress; Tin; external stress; growth behaviour; tin coating; tin whisker;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
Conference_Location
Chengdu
Type
conf
DOI
10.1109/ICEPT.2014.6922836
Filename
6922836
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