Title : 
A 3D pointcloud registration algorithm based on fast coherent point drift
         
        
            Author : 
Min Lu ; Jian Zhao ; Yulan Guo ; Jianping Ou ; Li, Janathan
         
        
            Author_Institution : 
Coll. of Electron. Sci. & Eng., Nat. Univ. of Defense Technol., Changsha, China
         
        
        
        
        
        
            Abstract : 
Pointcloud registration has a number of applications in various research areas. Computational complexity and accuracy are two major concerns for a pointcloud registration algorithm. This paper proposes a novel Fast Coherent Point Drift (F-CPD) algorithm for 3D pointcloud registration. The original CPD method is very time-consuming. The situation becomes even worse when the number of points is large. In order to overcome the limitations of the original CPD algorithm, a global convergent squared iterative expectation maximization (gSQUAREM) scheme is proposed. The gSQUAREM scheme uses an iterative strategy to estimate the transformations and correspondences between two pointclouds. Experimental results on a synthetic dataset show that the proposed algorithm outperforms the original CPD algorithm and the Iterative Closest Point (ICP) algorithm in terms of both registration accuracy and convergence rate.
         
        
            Keywords : 
computational complexity; expectation-maximisation algorithm; image registration; 3D pointcloud registration algorithm; computational complexity; convergence rate; fast coherent point drift; global convergent squared iterative expectation maximization; iterative closest point algorithm; registration accuracy; synthetic dataset; Algorithm design and analysis; Convergence; Iterative closest point algorithm; Mathematical model; Robustness; Three-dimensional displays; coherent point drift; expectation maximization; global convergent squared iterative EM scheme; pointcloud registration;
         
        
        
        
            Conference_Titel : 
Applied Imagery Pattern Recognition Workshop (AIPR), 2014 IEEE
         
        
            Conference_Location : 
Washington, DC
         
        
        
            DOI : 
10.1109/AIPR.2014.7041917