Multiport scattering matrix measurement using a reduced-port network analyzer

Author

Lu, Hsin-Chia ; Chu, Tah-Hsiung

Author_Institution

Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan

Volume

51

Issue

5

fYear

2003

fDate

5/1/2003 12:00:00 AM

Firstpage

1525

Lastpage

1533

Abstract

A novel method for acquiring the scattering matrix of an n-port network from measurements using a reduced-port network analyzer is developed. This method can obtain the scattering matrix of a nonreciprocal or reciprocal n-port network with the use of a three- or two-port network analyzer. The formulation of this method considers the imperfection of terminators used in the measurement, and only two of the terminators are required to be known. Experimental results from a four-port microstrip circuit show good accuracy using the developed method.

Keywords

S-matrix theory; microstrip circuits; microwave circuits; microwave measurement; multiport networks; network analysers; four-port microstrip circuit; multiport network; multiport scattering matrix measurement; nonreciprocal n-port network; reciprocal n-port network; reduced-port network analyzer; terminator imperfection; three-port network analyzer; two-port network analyzer; Calibration; Circuits; Helium; Instruments; Joining processes; Microstrip; Reflection; Scattering; Testing; Transmission line matrix methods;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/TMTT.2003.810134

Filename

1196183