Title :
Characterization of RF Transistors For AM/FM Radio Applications
Author :
Gertzis, Selig ; Bosselaers, Robrecht
Author_Institution :
Amperex Electronic Corporation, Hicksville, L.I., New York
Keywords :
Admittance; Radio frequency; Stability;
Journal_Title :
Broadcast and Television Receivers, IRE Transactions on
DOI :
10.1109/TBTR2.1962.4503240
