DocumentCode
1188406
Title
Frequency Stability Analysis of Transistorized Crystal Oscillator
Author
Knapp, Guenther
Author_Institution
Sperry Rand Research Center, Division of Sperry Rand Corporation, Sudbury, Mass.
Volume
12
Issue
1
fYear
1963
fDate
6/1/1963 12:00:00 AM
Firstpage
2
Lastpage
6
Abstract
This paper gives an analysis of a modified Pierce oscillator for frequency variation due to changes in the circuit or transistor. The magnitudes of the frequency shifts due to parameter changes are computed in relation to each other. The analysis has been verified by testing the oscillator circuit with several transistors which had significantly different measured parameters. Computed frequency shifts were compared with measured frequency shifts. The agreement between experimental and calculated data is ¿8Ã10-9 with a 5 Mc, fifth overtone quartz crystal in the circuit. A general equation relating frequency changes to changes in circuit parameters has been derived and is applicable to any operating frequency as long as the y parameters of the transistor and the circuit elements of the oscillator are known.
Keywords
Circuit stability; Circuit testing; Differential equations; Equivalent circuits; Frequency measurement; Inductance; Inductors; Oscillators; Resistors; Stability analysis;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1963.4313318
Filename
4313318
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