• DocumentCode
    1188406
  • Title

    Frequency Stability Analysis of Transistorized Crystal Oscillator

  • Author

    Knapp, Guenther

  • Author_Institution
    Sperry Rand Research Center, Division of Sperry Rand Corporation, Sudbury, Mass.
  • Volume
    12
  • Issue
    1
  • fYear
    1963
  • fDate
    6/1/1963 12:00:00 AM
  • Firstpage
    2
  • Lastpage
    6
  • Abstract
    This paper gives an analysis of a modified Pierce oscillator for frequency variation due to changes in the circuit or transistor. The magnitudes of the frequency shifts due to parameter changes are computed in relation to each other. The analysis has been verified by testing the oscillator circuit with several transistors which had significantly different measured parameters. Computed frequency shifts were compared with measured frequency shifts. The agreement between experimental and calculated data is ¿8×10-9 with a 5 Mc, fifth overtone quartz crystal in the circuit. A general equation relating frequency changes to changes in circuit parameters has been derived and is applicable to any operating frequency as long as the y parameters of the transistor and the circuit elements of the oscillator are known.
  • Keywords
    Circuit stability; Circuit testing; Differential equations; Equivalent circuits; Frequency measurement; Inductance; Inductors; Oscillators; Resistors; Stability analysis;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1963.4313318
  • Filename
    4313318