• DocumentCode
    1188426
  • Title

    Semiautomatic Transistor Characteristic-Curve Plotter

  • Author

    Fischler, H. ; Yerushalmi, S.

  • Author_Institution
    Department of Electronics, Weizmann Institute of Science, Rehovoth, Israel
  • Volume
    12
  • Issue
    1
  • fYear
    1963
  • fDate
    6/1/1963 12:00:00 AM
  • Firstpage
    13
  • Lastpage
    16
  • Abstract
    A simple semiautomatic instrument for tracing common-emitter hybrid collector and base characteristics of low-level transistors is described. DC supplies, including a transistorized automatic and continuously varying voltage supply, are encountered in the network which allows appropriate biasing of transistors to be tested. Plotting of transistor curves is provided by a conventional X-Y recorder. The range of the instrument comprises: for plotting collector characteristics¿base currents up to 40 ¿a, collector voltages up to 15 v; for base characteristics¿base currents up to about 30 ¿a. The instrument enables accurate and rapid plotting of transistor characteristics, which is of considerable importance for special design purposes, when trade data of transistors prove to be inadequate.
  • Keywords
    Automatic testing; Circuit noise; Electrical resistance measurement; Ferrites; Instruments; Low voltage; Noise measurement; Resonance; Tensile stress; Transistors;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1963.4313320
  • Filename
    4313320