DocumentCode
1188426
Title
Semiautomatic Transistor Characteristic-Curve Plotter
Author
Fischler, H. ; Yerushalmi, S.
Author_Institution
Department of Electronics, Weizmann Institute of Science, Rehovoth, Israel
Volume
12
Issue
1
fYear
1963
fDate
6/1/1963 12:00:00 AM
Firstpage
13
Lastpage
16
Abstract
A simple semiautomatic instrument for tracing common-emitter hybrid collector and base characteristics of low-level transistors is described. DC supplies, including a transistorized automatic and continuously varying voltage supply, are encountered in the network which allows appropriate biasing of transistors to be tested. Plotting of transistor curves is provided by a conventional X-Y recorder. The range of the instrument comprises: for plotting collector characteristics¿base currents up to 40 ¿a, collector voltages up to 15 v; for base characteristics¿base currents up to about 30 ¿a. The instrument enables accurate and rapid plotting of transistor characteristics, which is of considerable importance for special design purposes, when trade data of transistors prove to be inadequate.
Keywords
Automatic testing; Circuit noise; Electrical resistance measurement; Ferrites; Instruments; Low voltage; Noise measurement; Resonance; Tensile stress; Transistors;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1963.4313320
Filename
4313320
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