DocumentCode :
1188464
Title :
CDF run IIb silicon vertex detector DAQ upgrade
Author :
Behari, S. ; Bacchetta, N. ; Bolla, G. ; Cardoso, G. ; Ciobanu, C.I. ; Flaugher, B. ; Garcia-Sciveres, M. ; Haber, C. ; Hara, K. ; Harr, R. ; Hsiung, T.H. ; Junk, T. ; Kim, S. ; Lu, R.-S. ; Lujan, P. ; Maksimovic, P. ; Merkel, P. ; Nord, B. ; Pavlicek, V.
Author_Institution :
Johns Hopkins Univ., Baltimore, MD, USA
Volume :
51
Issue :
6
fYear :
2004
Firstpage :
3047
Lastpage :
3054
Abstract :
The Collider Detector at Fermilab (CDF) operates in the beamline of the Tevatron proton-antiproton collider at Batavia, IL. The Tevatron is expected to undergo luminosity upgrades (Run IIb) in the future, resulting in a higher number of interactions per beam crossing. To operate in this dense radiation environment, an upgrade of the CDF´s silicon vertex detector subsystem and a corresponding upgrade of its VME-based DAQ system has been explored. Prototypes of all the Run IIb SVX DAQ components have been constructed, assembled into a test stand, and operated successfully using an adapted version of the CDF´s network-capable DAQ software. In addition, a PCI-based DAQ system has been developed as a fast and inexpensive tool for silicon detector and DAQ component testing in the production phase. We present an overview of the Run IIb silicon DAQ upgrade, emphasizing the new features and improvements incorporated into the constituent VME boards and discuss a PCI-based DAQ system developed to facilitate production tests.
Keywords :
data acquisition; high energy physics instrumentation computing; nuclear electronics; position sensitive particle detectors; reviews; silicon radiation detectors; CDF Run IIb silicon vertex detector DAQ upgrade; Collider Detector at Fermilab; PCI-based DAQ system; Run IIb SVX DAQ components; Tevatron proton-antiproton collider; VME-based DAQ system; beam crossing; data acquisition; dense radiation environment; electronic system; luminosity upgrades; network-capable DAQ software; overview; silicon strip detector; test stand; Assembly; Colliding beam devices; Data acquisition; Particle beams; Production systems; Radiation detectors; Silicon radiation detectors; Software prototyping; Software testing; System testing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2004.839065
Filename :
1369433
Link To Document :
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