• DocumentCode
    1188562
  • Title

    A ferroelectric memory-based secure dynamically programmable gate array

  • Author

    Masui, Shoichi ; Ninomiya, Tsuzumi ; Oura, Michiya ; Yokozeki, Wataru ; Mukaida, Kenji ; Kawashima, Shoichiro

  • Author_Institution
    Fujitsu Labs. Ltd., Akiruno, Japan
  • Volume
    38
  • Issue
    5
  • fYear
    2003
  • fDate
    5/1/2003 12:00:00 AM
  • Firstpage
    715
  • Lastpage
    725
  • Abstract
    A nonvolatile ferroelectric memory-based eight-context dynamically programmable gate array (DPGA) enables low-cost field programmable systems by the elimination of off-chip nonvolatile memories as well as the multicontext architecture. Since read and program sequences of configuration data loading from/to the DPGA are securely protected, unauthorized users cannot access the stored configuration data. The associated configuration memory consists of a SRAM-based six-transistor and 4-ferroelectric capacitor cell. The developed configuration memory achieves access time of 4ns, comparable to standard SRAM, which is 20 times faster than conventional ferroelectric memory; furthermore, it features a nondestructive read operation and a stable data recall scheme. The employed logic block circuit can effectively improve the available number of logic gates for the multicontext scheme with minimum area overhead. The prototype nonvolatile DPGA is fabricated in a 0.35-μm CMOS with ferroelectric memory technology, and the implementation result of the Data Encryption Standard (DES) encryption/decryption functions on this DPGA presents proper operation up to 51 MHz at 3.3V. The nonvolatile storage of configuration memory is verified for power-supply voltage as low as 1.5 V at room temperature, which is the lowest operation voltage ever reported for PbZrTiO3 (PZT)-based ferroelectric memories.
  • Keywords
    CMOS logic circuits; cryptography; ferroelectric capacitors; ferroelectric storage; field programmable gate arrays; 0.35 micron; 1.5 to 3.3 V; 4 ns; 51 MHz; CMOS; Data Encryption Standard; PZT; PbZrO3TiO3; PbZrTiO3; access time; area overhead; encryption/decryption functions; ferroelectric capacitor cell; low-cost field programmable systems; multicontext scheme; nondestructive read operation; nonvolatile ferroelectric memory; nonvolatile storage; secure dynamically programmable gate array; stable data recall scheme; CMOS logic circuits; Capacitors; Cryptography; Ferroelectric materials; Field programmable gate arrays; Logic circuits; Nonvolatile memory; Protection; Random access memory; Standards development;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2003.810034
  • Filename
    1196216