• DocumentCode
    118868
  • Title

    Effect of Pb content on shear performance of SnAgCu-xSnPb/Cu mixed solder joint

  • Author

    Wang Xin ; Li Xunping ; Pan Kailin ; Zhou Bin ; Jiang Tingbiao

  • Author_Institution
    Sch. of Mech. & Electron. Eng., Guilin Univ. of Electron. Technol. Guilin, Guilin, China
  • fYear
    2014
  • fDate
    12-15 Aug. 2014
  • Firstpage
    1173
  • Lastpage
    1176
  • Abstract
    In this study, the effect of series Pb content on shear performance of SnAgCu-xSnPb/Cu solder joint was investigated. It was found that Pb content influenced the BGA solder joint shear strength significantly. The shear strength as a function of Pb content shows a parabola trend. The shear strength increased with Pb content increased from 0% to 9.22%. Then the shear strength value kept at a high level from 9.22% to 26.49%. However, this trend stopped when Pb content is 29.42% and the shear strength began to decrease. The failure mode is strongly associated with fracture energy. When Pb was imported into Sn3.0Ag0.5Cu/Cu solder joint, the fracture energy (shear work) of solder joint shear test decreased. When Pb content ranges from 4.67% to 37% the fracture energy seemed no obvious difference. Pb content influenced the solidification sequence when the solder joint was cooling down. The solidification sequence is closely related to the microstructure of mixed solder joint.
  • Keywords
    ball grid arrays; copper; copper alloys; fracture; lead alloys; mechanical testing; shear strength; silver alloys; solders; solidification; tin alloys; BGA solder joint shear strength; SnAgCu-SnPb-Cu; ball grid arrays; failure mode; fracture energy; solder joint shear test; solidification sequence; Electronics packaging; Joints; Lead; Microstructure; Reliability; Soldering; Tin; Pb content; SnAgCu-xSnPb; ball shear; mixed solder joint;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
  • Conference_Location
    Chengdu
  • Type

    conf

  • DOI
    10.1109/ICEPT.2014.6922852
  • Filename
    6922852