• DocumentCode
    1188817
  • Title

    Alpha particle nonionizing energy loss (NIEL)

  • Author

    Jun, Insoo ; Xapsos, Michael A. ; Burke, Edward A.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    51
  • Issue
    6
  • fYear
    2004
  • Firstpage
    3207
  • Lastpage
    3210
  • Abstract
    A method previously developed for proton nonionizing energy loss (NIEL) calculations was extended to alpha particles. The alpha particle NIELs for representative device materials are presented from the damage threshold energy to 1GeV/n. The method used the Ziegler, Biersack, Littmark (ZBL) screened potential for Coulomb interactions and the MCNPX "thin target approximation" for nuclear interactions. The alpha NIEL obtained in this study was compared to the proton NIEL from the previous study. It is seen that for silicon, the NIEL for alphas is about 16 times the NIEL for protons at 1.0 MeV/n where the Coulombic interaction dominates. The ratio drops at higher energies because of the nuclear contributions. Furthermore, a simple radiation transport analysis indicates that in a representative space environment, the contribution of alphas to the damage dose can be comparable to the proton contribution, and that shielding has a marked influence on the relative contributions.
  • Keywords
    alpha-particle effects; electric potential; energy loss of particles; high-energy cosmic ray interactions; space research; Coulomb interactions; MCNPX thin target approximation; Ziegler-Biersack-Littmark screened potential; alpha particle nonionizing energy loss; cosmic rays; damage threshold energy; nuclear interactions; proton nonionizing energy loss; radiation transport analysis; representative device materials; screened Coulomb potential; space environment; Alpha particles; Energy loss; Gallium nitride; Ion implantation; Kinematics; Light emitting diodes; NASA; Physics; Protons; Silicon;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2004.839150
  • Filename
    1369471