• DocumentCode
    118890
  • Title

    Study on fracture mechanism of the aged Sn2.5Ag0.7Cu0.1RE/Cu soldering joint with external energy

  • Author

    Xingdong Guo ; Keke Zhang

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Henan Univ. of Sci. & Technol., Luoyang, China
  • fYear
    2014
  • fDate
    12-15 Aug. 2014
  • Firstpage
    1212
  • Lastpage
    1214
  • Abstract
    With ultrasonic vibration and electric field, Sn2.5Ag0.7Cu0.1RE/Cu solder was experimented. Mechanical property and fracture mechanism of aged joint were researched with the modern physical and chemical detection methods. The results show that when ultrasonic power is 88w, time is 60s, electric field is 2 kV/cm, aging treatment temperature is 150°C, aging time is 200h, the shear strength of soldering joint can achieve 21.54 MPa, which is 47.5% higher than that of traditional soldering. The brittle fracture of traditional soldering joint occurred in the IMC layer. While mixed-fracture composed of granular IMC phase and "parabola" shear dimple of brittle and ductile was observed in the interface of the soldering joint with ultrasonic vibration. Particularly, ductile fracture composed of large sized "parabola" shear dimple was detected in the soldering seam of the aged joint with ultrasonic vibration and electric field.
  • Keywords
    copper; electric fields; fracture mechanics; silver compounds; soldering; tin compounds; vibrations; IMC layer; Sn2.5Ag0.7Cu0.1RE-Cu solder; Sn2.5Ag0.7Cu0.1-Cu; aged joint; brittle fracture; chemical detection methods; ductile fracture; electric field; fracture mechanism; granular IMC phase; mechanical property; mixed-fracture; parabola shear dimple; physical detection methods; power 88 W; pressure 21.52 MPa; shear strength; soldering joint; soldering seam; temperature 150 C; time 200 h; time 60 s; ultrasonic vibration; Acoustics; Aging; Electric fields; Joints; Metals; Soldering; Vibrations; Sn2.5Ag0.7Cu0. 1RE solder; aging; electric field; fracture mechanism; ultrasonic vibration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
  • Conference_Location
    Chengdu
  • Type

    conf

  • DOI
    10.1109/ICEPT.2014.6922861
  • Filename
    6922861