DocumentCode :
1188966
Title :
A Study of the Effect of Aging on the Operation of Switching Devices
Author :
Carfagno, S.P. ; Heberlein, G. Erich, Jr.
Author_Institution :
Franklin Research Center
Issue :
6
fYear :
1980
Firstpage :
2272
Lastpage :
2280
Abstract :
An experimental study was conducted to determine whether equipment aging affects the vulnerability of electric switching devices to malfunction caused by vibratory stresses in the range of seismic frequencies and acceleration amplitudes. The study included a vibration test before and after a program of accelerated aging designed to simulate forty years of service in areas outside the containment of a nuclear power generating station. Gamma irradiation, thermal aging, electrical/mechanical cycling and simulation of operating basis earth- quakes were included in the program of accelerated aging. Malfunction was defined as spurious opening or closing of contacts for times in excess of 1 ms during the vibration tests.
Keywords :
Accelerated aging; Circuit breakers; Fuses; Life estimation; Power generation; Qualifications; Relays; Stress; Testing; Vibrations;
fLanguage :
English
Journal_Title :
Power Apparatus and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9510
Type :
jour
DOI :
10.1109/TPAS.1980.319787
Filename :
4114065
Link To Document :
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