• DocumentCode
    1189001
  • Title

    Long-term testing in a short-term world

  • Author

    Rokosz, Vaughn T.

  • Volume
    20
  • Issue
    3
  • fYear
    2003
  • Firstpage
    64
  • Lastpage
    67
  • Abstract
    Accelerated stress testing reduces the time required to test a system but can be hard to apply to functions running on a fixed schedule. This article describes how to accelerate the testing of scheduled functions by triggering them through automated tests, either by periodically advancing the system clock or through a programmatic event interface. With this method, the accelerated stress tests don´t distort the system´s operational profile.
  • Keywords
    life testing; program testing; accelerated stress testing; automated tests; programmatic event interface; Automatic testing; Calendars; Central Processing Unit; Clocks; Life estimation; Operating systems; Software testing; Stress; System testing; Topology;
  • fLanguage
    English
  • Journal_Title
    Software, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7459
  • Type

    jour

  • DOI
    10.1109/MS.2003.1196323
  • Filename
    1196323