DocumentCode
1189001
Title
Long-term testing in a short-term world
Author
Rokosz, Vaughn T.
Volume
20
Issue
3
fYear
2003
Firstpage
64
Lastpage
67
Abstract
Accelerated stress testing reduces the time required to test a system but can be hard to apply to functions running on a fixed schedule. This article describes how to accelerate the testing of scheduled functions by triggering them through automated tests, either by periodically advancing the system clock or through a programmatic event interface. With this method, the accelerated stress tests don´t distort the system´s operational profile.
Keywords
life testing; program testing; accelerated stress testing; automated tests; programmatic event interface; Automatic testing; Calendars; Central Processing Unit; Clocks; Life estimation; Operating systems; Software testing; Stress; System testing; Topology;
fLanguage
English
Journal_Title
Software, IEEE
Publisher
ieee
ISSN
0740-7459
Type
jour
DOI
10.1109/MS.2003.1196323
Filename
1196323
Link To Document