DocumentCode :
1189001
Title :
Long-term testing in a short-term world
Author :
Rokosz, Vaughn T.
Volume :
20
Issue :
3
fYear :
2003
Firstpage :
64
Lastpage :
67
Abstract :
Accelerated stress testing reduces the time required to test a system but can be hard to apply to functions running on a fixed schedule. This article describes how to accelerate the testing of scheduled functions by triggering them through automated tests, either by periodically advancing the system clock or through a programmatic event interface. With this method, the accelerated stress tests don´t distort the system´s operational profile.
Keywords :
life testing; program testing; accelerated stress testing; automated tests; programmatic event interface; Automatic testing; Calendars; Central Processing Unit; Clocks; Life estimation; Operating systems; Software testing; Stress; System testing; Topology;
fLanguage :
English
Journal_Title :
Software, IEEE
Publisher :
ieee
ISSN :
0740-7459
Type :
jour
DOI :
10.1109/MS.2003.1196323
Filename :
1196323
Link To Document :
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