• DocumentCode
    1189071
  • Title

    Single event transient pulsewidth measurements using a variable temporal latch technique

  • Author

    Eaton, P. ; Benedetto, J. ; Mavis, D. ; Avery, K. ; Sibley, M. ; Gadlage, M. ; Turflinger, T.

  • Author_Institution
    ATK Mission Res., Albuquerque, NM, USA
  • Volume
    51
  • Issue
    6
  • fYear
    2004
  • Firstpage
    3365
  • Lastpage
    3368
  • Abstract
    A new test structure was designed for measuring the pulsewidths of transients created by SETs. Experimental data was gathered using heavy ions from LETs of 11.5 to 84MeV-cm2/mg. The pulsewidths of SETs generated using heavy ions are measured using a variable temporal latch. Our SET´s widths at low LETs agree exceptionally well with previous localized beam measurements.
  • Keywords
    CMOS digital integrated circuits; flip-flops; ion beam effects; semiconductor device models; transients; CMOS gates; heavy ions; single event transient pulsewidth; test structure design; variable temporal latch technique; Clocks; Delay; Latches; Leg; Logic; Pulse generation; Pulse measurements; Single event upset; Space vector pulse width modulation; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2004.840020
  • Filename
    1369496
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1189071