Title :
Single event transient pulsewidth measurements using a variable temporal latch technique
Author :
Eaton, P. ; Benedetto, J. ; Mavis, D. ; Avery, K. ; Sibley, M. ; Gadlage, M. ; Turflinger, T.
Author_Institution :
ATK Mission Res., Albuquerque, NM, USA
Abstract :
A new test structure was designed for measuring the pulsewidths of transients created by SETs. Experimental data was gathered using heavy ions from LETs of 11.5 to 84MeV-cm2/mg. The pulsewidths of SETs generated using heavy ions are measured using a variable temporal latch. Our SET´s widths at low LETs agree exceptionally well with previous localized beam measurements.
Keywords :
CMOS digital integrated circuits; flip-flops; ion beam effects; semiconductor device models; transients; CMOS gates; heavy ions; single event transient pulsewidth; test structure design; variable temporal latch technique; Clocks; Delay; Latches; Leg; Logic; Pulse generation; Pulse measurements; Single event upset; Space vector pulse width modulation; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2004.840020
