DocumentCode
1189078
Title
Node-fault diagnosis and a design of testability
Author
Huang, Zheng F. ; Lin, Chen-Shang ; Liu, Ruey-Wen
Volume
30
Issue
5
fYear
1983
fDate
5/1/1983 12:00:00 AM
Firstpage
257
Lastpage
265
Abstract
A concept of 
-node-fault testability is introduced. A sufficient and almost necessary condition for testability as well as the test procedure is presented. This condition is further evolved to a necessary and almost sufficient topological condition for testability. A unique feature of this condition is that it depends only on the graph of the circuit, not on the element values. Based on this condition, a design of testability can be established.
-node-fault testability is introduced. A sufficient and almost necessary condition for testability as well as the test procedure is presented. This condition is further evolved to a necessary and almost sufficient topological condition for testability. A unique feature of this condition is that it depends only on the graph of the circuit, not on the element values. Based on this condition, a design of testability can be established.Keywords
Analog system fault diagnosis; Large scale networks and power systems; Circuit faults; Circuit testing; Equations; Fault detection; Fault diagnosis; Fault location; Impedance; Symmetric matrices; Transfer functions; Voltage;
fLanguage
English
Journal_Title
Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0098-4094
Type
jour
DOI
10.1109/TCS.1983.1085359
Filename
1085359
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