DocumentCode
1189111
Title
Contributors
Issue
1
fYear
1962
fDate
3/1/1962 12:00:00 AM
Firstpage
29
Lastpage
30
Abstract
Contains an entry for each author and coauthor included in this issue of the publication.
Keywords
Atmospheric modeling; Integrated circuit reliability; Laboratories; Modeling; Psychology; Reliability; Reliability engineering; arsenic; astatine; fluorine; indium; iodine; mass; nitrogen;
fLanguage
English
Journal_Title
Human Factors in Electronics, IRE Transactions on
Publisher
ieee
ISSN
0099-4561
Type
jour
DOI
10.1109/THFE2.1962.4503333
Filename
4503333
Link To Document