Title :
Identification of Dominant Noise Source and Parameter Sensitivity for Substrate Coupling
Author :
Salman, Emre ; Friedman, Eby G. ; Secareanu, Radu M. ; Hartin, Olin L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Rochester, Rochester, NY, USA
Abstract :
A simple, yet physically intuitive macrolevel model is presented to identify the dominant substrate coupling mechanism at the early stages of the design process, while simultaneously considering multiple parameters. Furthermore, the sensitivity of substrate noise to these parameters is evaluated, demonstrating the nonmonotonic dependence of noise on rise time. The design implications of the proposed analysis are discussed, identifying the preferred noise reduction technique for a specific set of operating points.
Keywords :
integrated circuit noise; mixed analogue-digital integrated circuits; substrates; dominant noise source; macrolevel model; noise reduction technique; nonmonotonic noise dependence; parameter sensitivity; substrate coupling; Dominant substrate noise source; mixed-signal circuits; substrate noise coupling;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2008.2005195