• DocumentCode
    1189223
  • Title

    Identification of Dominant Noise Source and Parameter Sensitivity for Substrate Coupling

  • Author

    Salman, Emre ; Friedman, Eby G. ; Secareanu, Radu M. ; Hartin, Olin L.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Rochester, Rochester, NY, USA
  • Volume
    17
  • Issue
    10
  • fYear
    2009
  • Firstpage
    1559
  • Lastpage
    1564
  • Abstract
    A simple, yet physically intuitive macrolevel model is presented to identify the dominant substrate coupling mechanism at the early stages of the design process, while simultaneously considering multiple parameters. Furthermore, the sensitivity of substrate noise to these parameters is evaluated, demonstrating the nonmonotonic dependence of noise on rise time. The design implications of the proposed analysis are discussed, identifying the preferred noise reduction technique for a specific set of operating points.
  • Keywords
    integrated circuit noise; mixed analogue-digital integrated circuits; substrates; dominant noise source; macrolevel model; noise reduction technique; nonmonotonic noise dependence; parameter sensitivity; substrate coupling; Dominant substrate noise source; mixed-signal circuits; substrate noise coupling;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2008.2005195
  • Filename
    4799227