Title :
Single-event destructive failure in a bipolar ASIC
Author :
Rickey, P. ; Stapor, W.J. ; McDonald, P.T. ; Abare, W. ; Gonyea, R.
Author_Institution :
Stapor Res. Inc., Chantilly, VA, USA
Abstract :
Single-event destructive failure has been observed in Maxim C-Pi process bipolar application-specific integrated circuits (ASICs) for both heavy ions and protons. We discuss the observed failures, proposed mechanism of failure, and significance for space applications.
Keywords :
application specific integrated circuits; bipolar integrated circuits; bipolar transistors; ion beam effects; proton effects; Maxim C-Pi process bipolar application-specific integrated circuits; SEE; bipolar ASIC; bipolar integrated devices; bipolar transistors; heavy ions; multijunction technologies; plasma; protons; single-event destructive failure; single-event effects; space applications; Application specific integrated circuits; Bipolar integrated circuits; Circuit testing; Clocks; Performance evaluation; Protection; Protons; Space technology; Temperature dependence; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2004.839191
