Title :
Frequency dependence of single-event upset in advanced commercial PowerPC microprocessors
Author :
Irom, F. ; Farmanesh, F.F.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
Single-event upset (SEU) from heavy ions is measured for advanced commercial microprocessors in a dynamic mode with clock frequencies up to 1 GHz. Frequency and core voltage dependence of SEUs in registers and D-Cache are discussed. The results of our studies suggest the SEU in registers and D-Cache tend to increase with frequency. This might have important implications for the overall SEU trend as technology moves toward higher frequencies.
Keywords :
cache storage; ion beam effects; microprocessor chips; silicon-on-insulator; 1 GHz; D-cache; SEU; Si-SiO2; advanced commercial powerPC microprocessors; clock frequencies; core voltage dependence; cyclotron; frequency dependence; general purpose registers; heavy ions; silicon-on-insulator; single-event upset; Aerodynamics; Cache storage; Clocks; Frequency dependence; Frequency measurement; Logic; Microprocessors; Performance evaluation; Single event upset; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2004.839111
