• DocumentCode
    1189291
  • Title

    Frequency dependence of single-event upset in advanced commercial PowerPC microprocessors

  • Author

    Irom, F. ; Farmanesh, F.F.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    51
  • Issue
    6
  • fYear
    2004
  • Firstpage
    3505
  • Lastpage
    3509
  • Abstract
    Single-event upset (SEU) from heavy ions is measured for advanced commercial microprocessors in a dynamic mode with clock frequencies up to 1 GHz. Frequency and core voltage dependence of SEUs in registers and D-Cache are discussed. The results of our studies suggest the SEU in registers and D-Cache tend to increase with frequency. This might have important implications for the overall SEU trend as technology moves toward higher frequencies.
  • Keywords
    cache storage; ion beam effects; microprocessor chips; silicon-on-insulator; 1 GHz; D-cache; SEU; Si-SiO2; advanced commercial powerPC microprocessors; clock frequencies; core voltage dependence; cyclotron; frequency dependence; general purpose registers; heavy ions; silicon-on-insulator; single-event upset; Aerodynamics; Cache storage; Clocks; Frequency dependence; Frequency measurement; Logic; Microprocessors; Performance evaluation; Single event upset; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2004.839111
  • Filename
    1369517
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1189291