• DocumentCode
    1189351
  • Title

    A comprehensive analog single-event transient analysis methodology

  • Author

    Savage, MarkW ; Titus, Jeffery L. ; Turflinger, Thomas L. ; Pease, Ronald L. ; Poivey, Christian

  • Author_Institution
    NAVSEA Crane, IN, USA
  • Volume
    51
  • Issue
    6
  • fYear
    2004
  • Firstpage
    3546
  • Lastpage
    3552
  • Abstract
    A new method for analyzing analog single-event transient (ASET) data has been developed. The approach allows for quantitative error calculations, given device failure thresholds. The method is described and employed in the analysis of an OP-27 op-amp.
  • Keywords
    error analysis; ion beam effects; operational amplifiers; transient analysis; OP-27 operational amplifier; analog single-event transient analysis methodology; device failure thresholds; heavy ions; quantitative error calculations; Circuit testing; Cranes; Digital relays; Energy exchange; FETs; Operational amplifiers; Oscilloscopes; Pulse measurements; Transient analysis; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2004.839107
  • Filename
    1369523
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1189351