DocumentCode :
1189483
Title :
A generalized Fock space framework for nonlinear system and signal analysis
Author :
de Figueiredo, Rui J.P.
Volume :
30
Issue :
9
fYear :
1983
fDate :
9/1/1983 12:00:00 AM
Firstpage :
637
Lastpage :
647
Abstract :
A unified framework is presented for nonlinear (and, in particular, linear) system and signal analysis, whereby a number of problems involving approximation and inversion of nonlinear functions, nonlinear functionals, and nonlinear operators, are cast in a reproducing kernel Hilbert space (RKHS) setting, and solved by orthogonal projection methods. The RKHS\´s used for the above purpose are the "arbitrarily weighted Fock spaces" introduced by de Figueiredo and Dwyer in II] and called in the present paper "generalized Fock (GF) spaces". These spaces consist of polynomials or power series in one or more scalar variables, or of finite (polynomic case) or infinite Volterra functional series in one or more functions, or of finite or infinite Volterra operator series in one or more functions. In each case, the space is equipped with an appropriate weighted inner product, with the option of making the choice of weights depend on the particular problem under consideration. These developments are illustrated by means of various applications, in particular, the modeling of semiconductor device characteristics, best approximation of nonlinear systems, and cancellation of large nonlinear distortion in signals propagating through electronic equipment.
Keywords :
Nonlinear distortions; Nonlinear modeling; Nonlinear systems; Semiconductor device models; Signal analysis; Bipolar transistor circuits; Ear; Hilbert space; Kernel; MOSFETs; Nonlinear distortion; Nonlinear systems; Polynomials; Semiconductor devices; Signal analysis;
fLanguage :
English
Journal_Title :
Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-4094
Type :
jour
DOI :
10.1109/TCS.1983.1085402
Filename :
1085402
Link To Document :
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