Title :
Effects of beam spot size on the correlation between laser and heavy ion SEU testing
Author :
Miller, Florent ; Buard, Nadine ; Carrière, Thierry ; Dufayel, Richard ; Gaillard, Rémi ; Poirot, Patrick ; Palau, Jean-Marie ; Sagnes, Bruno ; Fouillat, Pascal
Author_Institution :
Corporate Res. Center, Eur. Aeronaut. Defence & Space Co., Suresnes, France
Abstract :
This work presents new results to compare EADS CCR laser experiments and heavy ion tests. More precisely, this study describes the influence of the laser spot size on the threshold energy of the SEU cross-section curves. A new methodology is proposed to correlate laser to heavy ion results.
Keywords :
SRAM chips; ion beam effects; laser beam effects; EADS CCR laser experiments; SRAM; beam spot size effects; heavy ion single event upset testing; laser spot size; single event effect; single event upset cross-section curves; threshold energy; Absorption; Ion accelerators; Ionization; Laser beams; Laser theory; Pulsed laser deposition; Random access memory; Silicon; Single event upset; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2004.839261
