Title :
Proton radiation response of monolithic Millimeter-wave transceiver building blocks implemented in 200 GHz SiGe technology
Author :
Kuo, Wei-Min Lance ; Lu, Yuan ; Floyd, Brian A. ; Haugerud, Becca M. ; Sutton, Akil K. ; Krithivasan, Ramkumar ; Cressler, John D. ; Gaucher, Brian P. ; Marshall, Paul W. ; Reed, Robert A. ; Freeman, Greg
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This work presents the first experimental results on the effects of 63.3 MeV proton irradiation on 60 GHz monolithic point-to-point broadband space data link transceiver building blocks implemented in a 200 GHz SiGe heterojunction bipolar transistor (HBT) technology. A SiGe low-noise amplifier and a SiGe voltage-controlled oscillator were each irradiated to proton fluences of 5.0×1013 p/cm2. The device and circuit level performance degradation associated with these extreme proton fluences is found to be minimal, suggesting that such SiGe HBT transceivers should be robust from a proton tolerance perspective for space applications, without intentional hardening at either the device or circuit level.
Keywords :
Ge-Si alloys; MIMIC; amplifiers; heterojunction bipolar transistors; proton effects; satellite communication; semiconductor heterojunctions; transceivers; voltage-controlled oscillators; 200 Hz; HBT; SiGe; SiGe heterojunction bipolar transistor technology; circuit level performance; degradation; device level performance; intentional hardening; intersatellite communication; low-noise amplifier; monolithic millimeter-wave transceiver building blocks; monolithic point-to-point broadband space data link transceiver building blocks; proton radiation; proton tolerance; silicon-germanium transceiver; space applications; voltage-controlled oscillator; Circuits; Germanium silicon alloys; Heterojunction bipolar transistors; Low-noise amplifiers; Millimeter wave technology; Millimeter wave transistors; Protons; Silicon germanium; Space technology; Transceivers;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2004.839215