DocumentCode :
1189785
Title :
Magnetoresistance in magnetic tunnel junctions with amorphous electrodes
Author :
Nakajima, Kentaro ; Feng, Gen ; Coey, J.M.D.
Author_Institution :
Phys. Dept., Trinity Coll., Dublin, Ireland
Volume :
41
Issue :
10
fYear :
2005
Firstpage :
2609
Lastpage :
2611
Abstract :
Magnetic tunnel junctions (MTJs) with amorphous CoFeB and Co2MnSi electrodes were fabricated and examined. In the case of [Co90Fe10]100-xBx, the x=32% boron addition reduces the magnetization by 30% compared to Co90Fe10, yet the reduction of the tunnel magnetoresistance (TMR) is over 95%. On the contrary, in the case of Co(100-x-y)MnxSiy, although net magnetization is very small at room temperature, the TMR can be as large as 7%. The character of each metalloid (boron and silicon) could be responsible for the peculiar behavior to each system.
Keywords :
amorphous magnetic materials; boron alloys; cobalt alloys; electrodes; iron alloys; magnetisation; manganese alloys; silicon alloys; tunnelling magnetoresistance; Co2MnSi; CoFeB; MTJ; TMR; amorphous electrodes; magnetic tunnel junctions; spin-dependent tunneling; tunnel magnetoresistance; Amorphous materials; Boron; Electrodes; Magnetic films; Magnetic materials; Magnetic tunneling; Magnetization; Plasma temperature; Sputtering; Tunneling magnetoresistance; Amorphous; MTJ; spin-dependent tunneling;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2005.854717
Filename :
1519064
Link To Document :
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