DocumentCode :
1189944
Title :
On a theory of t-fault diagnosable analog systems
Author :
Hakimi, S. Louis ; Nakajima, Kazuo
Volume :
31
Issue :
11
fYear :
1984
fDate :
11/1/1984 12:00:00 AM
Firstpage :
946
Lastpage :
951
Abstract :
The theory of 
-fault diagnosable systems initiated by Preparata et al. has been studied for applications to automatic self-testing of large scale digital systems. Recently, Amin introduced another variation of their model. In this paper, we show that this model has an application to analog fault diagnosis. We further specialize Amin\´s model to obtain characterization theorems which are much more transparent and also are more suitable for this particular application.
-fault diagnosable systems initiated by Preparata et al. has been studied for applications to automatic self-testing of large scale digital systems. Recently, Amin introduced another variation of their model. In this paper, we show that this model has an application to analog fault diagnosis. We further specialize Amin\´s model to obtain characterization theorems which are much more transparent and also are more suitable for this particular application.Keywords :
Analog system fault diagnosis; Fault analysis; Built-in self-test; Circuit faults; Circuit testing; Digital systems; Fault diagnosis; Helium; Large-scale systems; Military computing; Performance evaluation; System testing;
fLanguage :
English
Journal_Title :
Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-4094
Type :
jour
DOI :
10.1109/TCS.1984.1085448
Filename :
1085448
Link To Document :
