Title :
Enhancement of tunnel magnetoresistance with oxidized AlHf-alloy for a tunnel barrier
Author :
Komagaki, Koujiro ; Noma, Kenji ; Yamada, Kouji ; Kanai, Hitoshi ; Uehara, Yuji
Author_Institution :
Adv. Head Technol. Dev. Dept., Fujitsu Ltd., Nagano, Japan
Abstract :
We investigated the tunnel magnetoresistance (TMR) with oxidized AlHf-Alloy barrier layer. As a result, at the range of Hf content (CHf) from 0 at.% to 70 at.% the enhancement of the tunnel magnetoresistance ratio with the AlHf-oxide barrier was observed, especially, the TMR ratio was greatly increased from 9.6% to 21.4% when the CHf increased from 0 at.% to 17 at.%. Furthermore, we found the enhanced TMR ratio with AlHf layer at thin barrier thickness less than 0.55 nm at which the TMR ratio with Al layer was not observed. And the breakdown voltage was improved with the AlHf-oxide barrier. These results are explained by the consideration that a uniformity of the oxidation in the AlHf layer composed with an amorphous or a nanocrystallized state was better than that in the Al layer composed with the large grain boundaries such as fcc-Al.
Keywords :
aluminium alloys; amorphous magnetic materials; crystal structure; grain boundaries; hafnium alloys; sputter deposition; tunnelling magnetoresistance; AlHf; TMR; amorphous state; barrier layer; breakdown voltage; grain boundaries; nanocrystallized state; oxidation; tunnel barrier; tunnel magnetoresistance; Amorphous materials; Atmosphere; Enhanced magnetoresistance; Hafnium; Hard disks; Magnetic films; Magnetic heads; Oxidation; Tunneling magnetoresistance; Zirconium; AlHf oxide; amorphous; resistance-area product (RA); tunnel barrier; tunnel magnetoresistance (TMR);
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2005.855290