Title :
Magnetization switching dynamics depending on as-patterned magnetization state in magnetic thin-film elements
Author :
Choi, B.C. ; Ho, J. ; Hong, Y.K. ; Park, M.H. ; Han, H. ; Gee, S.H. ; Donohoe, G.W.
Author_Institution :
Dept. of Phys. & Astron., Victoria Univ., BC, Canada
Abstract :
Magnetization configuration and magnetic switching dynamics of submicrometer "Pac-man"-shaped Ni80Fe20 elements with conventional and modified (i.e., elongated) geometry have been studied using magnetic force microscopy (MFM), magnetooptic Kerr effect (MOKE), and micromagnetic simulations. It was found that the sensitive interplay between exchange, demagnetizing, and shape anisotropy energies leads to distinct magnetization configurations and magnetic switching mechanisms (in low frequencies), even though the geometric shape of elements is only slightly modified. In a particular case, such as 40% elongated element, vortex-driven magnetic switching is replaced by well-defined coherent reversal. Fast magnetization reversal is, however, found to be slightly dependent on as-patterned domain configurations. For all elements investigated, the fast reversal leads to very complex nonequilibrium domain configurations.
Keywords :
Kerr magneto-optical effect; exchange interactions (electron); iron alloys; magnetic anisotropy; magnetic force microscopy; magnetic switching; magnetic thin films; magnetisation reversal; nickel alloys; MFM; MOKE; Ni80Fe20; demagnetizing energies; exchange energies; geometric shape; magnetic force microscopy; magnetic switching dynamics; magnetic thin film; magnetization configurations; magnetization reversal; magnetization state; magnetooptic Kerr effect; micromagnetic simulations; sensitive interplay; shape anisotropy energies; Geometry; Iron; Kerr effect; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetic switching; Magnetization; Magnetooptic effects; Shape; Magnetic hysteresis; magnetization dynamics; magnetization reversal; magnetooptic Kerr effect (MOKE);
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2005.854886