Title :
Angular dependence of exchange bias and coercive field in CoFe/MnIr epitaxial bilayers
Author :
Kim, Dong Young ; Kim, Cheol Gi ; Kim, Chong-Oh ; Shibata, M. ; Tsunoda, M. ; Takahashi, M.
Author_Institution :
Res. Center for Adv. Magnetic Mater., Chungnam Nat. Univ., Daejeon, South Korea
Abstract :
We have measured the hysteresis loop and torque curves at various applied magnetic field angle in CoFe/MnIr epitaxial bilayers on single crystal MgO [001], (111), and (011) samples. The [001] samples show double shifted magnetization curves, which are dominant as the MnIr thickness increases. It suggests that the unidirectional anisotropy and cubic anisotropy of CoFe [001] layer plays a key role in the formation of double shifted magnetization reversal. The angular variation of exchange bias (Hex) and coercive field (Hc) depend on the orientation of MgO substrates. The measured results are compared with calculated data, which are fitted using the crystalline anisotropy, unidirectional and uniaxial anisotropy induced by the field annealing. The calculated Hex and Hc as a function of measuring angles show similar trend as the measured ones. Theses energy contributions play an essential role in the angle dependent magnetization process in epitaxial CoFe/MnIr bilayers.
Keywords :
exchange interactions (electron); magnetic anisotropy; magnetic annealing; magnetic hysteresis; magnetic multilayers; CoFe [001] layer; CoFe-MnIr; MgO; coercive field; crystalline anisotropy; cubic anisotropy; epitaxial bilayers; exchange bias; field annealing; hysteresis loop; magnetic field angle; magnetization reversal; shifted magnetization curves; torque curves; unidirectional anisotropy; Anisotropic magnetoresistance; Annealing; Crystallization; Goniometers; Magnetic field measurement; Magnetic hysteresis; Magnetization processes; Magnetization reversal; Substrates; Torque measurement; Crystalline anisotropy; domain pattern; epitaxial bilayer; exchange bias and coercive field;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2005.854762